![]() The development of ultra low-emittance storage rings, first with MAX IV (Tavares et al., 2014 ) and soon after ESRF-EBS (Biasci et al., 2014 ) and Sirius (Liu et al., 2014 ), brings a dramatic increase in coherent flux. All optics, diffractive, refractive or reflective, have their advantages and disadvantages and no type is best for all energies, focus sizes, working distances and photon flux needs. Focus sizes often reach below 100 nm with examples below 10 nm (Bajt et al., 2018 ). Advances in nano-focusing optics fabrication allow focusing to the diffraction limit. A number of technology developments have been important to make SXM attractive to a broader community. Instrument and method development is rapid and most low-emittance synchrotron facilities are today operating or developing one or several hard X-ray nanoprobe beamlines (Leake et al., 2019 Holler et al., 2018 Chang et al., 2013 Chen et al., 2014 Martínez-Criado et al., 2016 Nazaretski et al., 2017 Quinn et al., 2021 Schropp et al., 2020 Somogyi et al., 2015 Tolentino et al., 2017 Winarski et al., 2012 de Jonge et al., 2014 ). High spatial resolution and large sample penetration depth allow for detailed studies of volume samples, often in their close to natural state. SXM is utilized in material science, life science, cultural heritage, environmental science, nano-technology and archaeology (Mino et al., 2018 Hémonnot & Köster, 2017 Cotte et al., 2018 ). ![]() Scanning hard X-ray microscopy (SXM) offers methods for structure, morphology and composition studies of heterogeneous sample systems. ![]()
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